Associate Prof. Tamar  Segal-Peretz


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Associate Prof. Tamar Segal-Peretz


Chemical Engineering

Main energy field:

Energy storage and conversion,

Membranes, 3D characterization


PhD – 2013 – Technion – Israel Institute of Technology – The Multidisciplinary Program for Nanoscience & Nanotechnology

BSc – 2006 – Technion – Israel Institute of Technology – Chemical Engineering

Research Interests:

Block copolymer self-assembly and organic-inorganic templating for energy production and storage devices, membrane for water-energy nexus, 3D characterization of nanostructures with TEM tomography

Selected Publications:

T. Segal-Peretz, J. Ren, S. Xiong, G. Khaira, A. Bowen, L. E. Ocola, R. Divan, M. Doxastakis, N. J. Ferrier, J. de Pablo, P. F. Nealey, Quantitative three dimensional characterization of block copolymer directed self -assembly on combined chemical and topographical pre-patterned templates, ACS Nano, 2016. View paper

J. Ren, L. E. Ocola, R. Divan, D. A. Czaplewski, T. Segal-Peretz, S. Xiong, R. J. Kline, C. G. Arges, P. F. Nealey, Post-directed-self-assembly membrane fabrication for in-situ analysis of block copolymer structures, Nanotechnology, 2016, 27 (43), 435303. View paper

T. Segal-Peretz, C. Zhou, J. Ren, T. Dazai, L. E. Ocola, R. Divan, P. F. Nealey, Three dimensional assembly in directed self-assembly of block copolymers, J. Photopolym. Sci. Technol., 2016, 29 (5), 653-657. View paper

S. Hur, V. Thapar, A. Ramirez-Hernandez, G. S. Khaira, T. Segal-Peretz, P. A. Rincon Delgadillo, M. Muller, P. F. Nealey, J. J. de Pablo, Molecular Pathways to Defect Annihilation in Directed Self-Assembly, Proceeding of the National Academy of Science, 2015, 112 (46), 14144-14149. View paper

T. Segal-Peretz, J. Winterstein, M. Doxastakis, A. Ramirez-Hernandez, M. Biswas, J. Ren, H. S. Suh, S. B. Darling, J. A. Liddle, J. W. Elam, J. J. de Pablo, N. Zaluzec, and P. F. Nealey, Deciphering the three-dimensional structure of block copolymers via sequential infiltration synthesis and scanning transmission electron tomography, ACS Nano, 2015, 9 (5), 5333-5347. View paper

T. Segal-Peretz, J. Winterstein, J. Ren, M. Biswas, J. A. Liddle, L. E. Ocola, R. N. S. Divan, J. W. Elam, N. Zaluzec, and P. F. Nealey, Metrology of DSA process using TEM tomography, Proc. of SPIE, 2015, 9424, 942401U-1. View paper